Test and Measurement Paradigm for Digital Wireless Systems

Abstract: The test and measurement example information of digital wireless system is provided by excellent flowmeter and flowmeter manufacturers. As the industry upgrades to 2.5G and 3G systems, power amplifier designers today face new design challenges. The proposed hybrid system allows service providers to smoothly transition to 3G systems while supporting existing infrastructure. This combines multiple carriers. More flowmeter manufacturers choose models and price quotations. You are welcome to inquire. The following is the details of the test and measurement example articles of digital wireless systems. As the industry upgrades to 2.5G and 3G systems, power amplifier designers today face new design challenges. The proposed hybrid system allows service providers to smoothly transition to 3G systems while supporting existing infrastructure. This combination of multiple carriers and multiple systems can be used to reduce system costs, accommodate data service requirements, and expand market coverage. Next-generation radio software-defined radio (SDR) is the technology that can drive this change. In the case of multi-carrier and multi-modulation schemes, amplifier designers face additional challenges when testing performance. This also requires a new architecture in test and measurement. To implement a software-defined radio scheme in a 3G system, the designer must first thoroughly test the amplifier performance in a test lab. To do this effectively, the latest modular test and measurement configurations must be employed. The modular solutions discussed in this article take full advantage of high linearity digital-to-analog converters (D/A), gigabyte solid-state memory, and wideband radio frequency (RF) up/down converters. As a result, very realistic test conditions are available in both laboratory and production testing. With these new test methods, the actual cumulative distribution function (CCDF) can be fully simulated; multi-carrier and multi-standard signals are generated; and very spectrally pure signals are provided. New digital linearization techniques can be tested to verify the effectiveness of new algorithms used to improve power amplifier performance. The adoption of these new amplifier designs by the industry requires more complex signal test equipment with a modular structure. Amplifier Testing Historically, power amplifier measurements have typically employed signal generators based on in-phase and quadrature (IQ) modulators. Originally optimized for single-carrier generation, such instruments have been expanded to meet today's needs for multi-carrier measurements. It features an analog IQ modulation circuit and waveform memory using dual D/A converters. Its function is sufficient for the case of single-criteria testing. But such generators (see Figure 1) have inherent limitations that drive base designers to turn to software-defined radio concepts for base station design. The IQ structure is sensitive to the imbalance of the I and Q baseband parts, the definition of the phase offset magnitude, and the channel imbalance caused by the DC offset. When the multi-carrier spectrum is asymmetric with respect to the RF carrier, the IQ structure becomes more difficult to optimize. The signal is prone to drift and requires manual adjustments, requiring constant iteration by the operator. All of these imbalances can interfere with the output and make adjacent carrier power (ACP) measurements less than optimal. For power amplifier testing, it is very important to tune the adjacent carrier power ratio (ACPR) for optimum performance. The testbench uses a software-defined radio concept as the structural basis for a vector signal generator, which can eliminate many of the shortcomings of current IQ-based generators. This concept uses a single D/A converter and an intermediate frequency (IF) to radio frequency (RF) upconversion chain (see Figure 2). It imitates the latest base station design structure. Adding gigabytes of memory after the D/A converter allows virtually unlimited flexibility in the generation of test signals. Thereby it has the ability to generate multi-carrier/multi-standard signals, as well as to record and play back the spectrum recording of the actual scene. This hardware and intuitive“Vector Signal Simulation”The combination of software enables test engineers and product developers to obtain the unlimited multi-carrier/multi-standard signal combinations they need. Vector signal simulation software enables designers to issue proprietary algorithms and custom modulation schemes that differ from equipment vendor modulation schemes. In order to make important CCDF statistical measurements, it is necessary to generate simulated signals for long periods of time. Multi-carrier/multi-standard signals can be generated to test amplifier performance for the latest 2G, 2.5G, and 3G base station configurations. In current I/Q-based test benches, the suppression of the local oscillator (LO) carrier frequency mainly depends on the fidelity of the I/Q modulator. In this design, stringent phase/amplitude matching and DC rejection are required to ensure optimal performance. This design is therefore more sensitive to drift, and the resulting spectral and constellation imbalances can severely limit the quality of test results. This drift is directly related to the statistical variation inherent in the part. In contrast, digital IF-based testbenches utilize RF bandpass filters and suppress RF carriers by optimally choosing the frequency offset between the IF and LO inputs. The digital IF-based test bench eliminates imbalances due to I/Q drift (phase, amplitude, and DC offset). The fundamental frequency is generated by the D/A process to achieve the highest performance. This signal is then upconverted to maintain a high-fidelity output.

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